DocumentCode
2649988
Title
The automatic generation of march tests
Author
van de Goor, A.J. ; Smit, B.
Author_Institution
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
fYear
1994
fDate
8-9 Aug 1994
Firstpage
86
Lastpage
91
Abstract
Many memory tests have been designed in the past, one class of tests which has been proven to be very efficient in terms of fault coverage as well as test time, is the class of march tests. Designing march tests is a tedious, manual task. This paper presents a method which can, given a set of fault models, automatically generate the required march tests. It has been implemented in the programming language C and shown to be effective
Keywords
automatic test software; fault diagnosis; finite state machines; integrated circuit testing; integrated memory circuits; random-access storage; C programming language; automatic generation; fault coverage; fault models; march tests; memory tests; Automata; Automatic testing; Decoding; Fault detection; Mathematical model; Performance evaluation; Read-write memory; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 1994., Records of the IEEE International Workshop on
Conference_Location
San Jose, CA
Print_ISBN
0-8186-6245-X
Type
conf
DOI
10.1109/MTDT.1994.397192
Filename
397192
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