• DocumentCode
    2650234
  • Title

    Mutual coupling of stacked UHF RFID antennas in NFC applications

  • Author

    Chen, Xiaosheng ; Lu, Feng ; Ye, Terry T.

  • Author_Institution
    Hong Kong R&D Center for Logistics & Supply Chain Manage. (LSCM), Hong Kong, China
  • fYear
    2009
  • fDate
    1-5 June 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    As RFID deployment moves from pallet level to item level, UHF RFID has gained more and more momentum in NFC (near field communication) applications recently. Similar to HF RFID tags, UHF RFID tags in NFC also use inductive coupling antennas to interact with the readers. However, in item-level deployment, items with UHF RFID tags are often stacked closely and interrogated by the reader simultaneously. Closely stacked RFID antennas have strong mutual coupling effects, which often lead to significant performance degradation and even failure. In this paper, we first present a mathematical model of the coupling effect of stacked RFID antennas and calculate the performance degradation at different locations of the stack. We then use Agilentreg AMDS to model a stack of 20 RFID labels and simulate the degradation effects. Furthermore, we perform lab tests on the 20-label stack and measure the sensitivity at different locations. The results from mathematical calculation, AMDS simulation and lab tests agree with each other nicely and demonstrate that the weak spots are not distributed monotonically along the stack.
  • Keywords
    UHF antennas; radiofrequency identification; AMDS simulation; Agilent AMDS; NFC application; UHF RFID tags; coupling effect; inductive coupling antennas; item-level deployment; mathematical model; mutual coupling; near field communication; stacked UHF RFID antennas; Degradation; Logistics; Magnetic flux density; Mutual coupling; RFID tags; Radiofrequency identification; Research and development; Tagging; Testing; UHF antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
  • Conference_Location
    Charleston, SC
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-3647-7
  • Type

    conf

  • DOI
    10.1109/APS.2009.5171863
  • Filename
    5171863