DocumentCode
2650329
Title
Multicore processor cluster based sleep transistor sizing considering delay profile
Author
Huang, Huang ; Fan, Jeffrey
Author_Institution
Dept. of Electr. & Comput. Eng., Florida Int. Univ., Miami, FL, USA
fYear
2009
fDate
20-23 Oct. 2009
Firstpage
654
Lastpage
657
Abstract
This paper proposed a novel method to size the sleep transistor by considering the slack time of the gates in non-critical path in delay profile. The circuit topology was considered to calculate the switching factor, which consequently gave us a more accurate estimation of gates´ discharge current. We implemented our method on a 4-bit adder. The proposed switching factor calculation could provide a more accurate estimation of switching current. In consideration of the slack time based on the delay profile, the equivalent worst case discharge current can be reduced, so that the number and the total size of sleep transistors can be dramatically reduced. In theory, the size of sleep transistor can be saved by up to a factor of 3, depending upon the design. In this paper, we also extended the sleep transistor sizing techniques into general multicore architecture. As an example, we modeled nine cores in design. Each core is assumed with different speed degradation allowed to process work loads with various performance requirements. Thus, a balanced design between power dissipation and circuit performance can be maintained.
Keywords
adders; microprocessor chips; transistor circuits; 4-bit adder; circuit topology; delay profile; equivalent worst case discharge current; multicore architecture; multicore processor cluster; power dissipation; sleep transistor sizing architecture; switching current estimation; switching factor; Adders; Circuit topology; Degradation; Delay effects; Multicore processing; Power dissipation; Sleep; Switching circuits; Threshold voltage; Timing; Low Power; Multicore; Slack Time; Sleep Transistor;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location
Changsha, Hunan
Print_ISBN
978-1-4244-3868-6
Electronic_ISBN
978-1-4244-3870-9
Type
conf
DOI
10.1109/ASICON.2009.5351331
Filename
5351331
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