DocumentCode
2651372
Title
Simulated Surface Enhanced Raman Spectroscopy via scattering on a dense, randomly-oriented, array of nanostructures
Author
Baczewski, A.D. ; Shanker, B. ; Kempel, L.C. ; Hogan, T.P.
Author_Institution
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fYear
2009
fDate
1-5 June 2009
Firstpage
1
Lastpage
4
Abstract
This work proposes a set of stochastic experiments that aims to study the surface enhanced Raman spectroscopy (SERS) parameter space in silico. The experimental procedure is modeled as optical scattering on an array of randomly oriented nanoscale dielectric scatterers. A deterministic volume integral equation with a periodic kernel is developed and solved using the method of moments. A Monte Carlo method is also employed to sample solutions of this integral equation for randomly generated configurations of scatterers closely resembling actual SERS substrates. By utilizing these numerical methods, both far- and near-field observables are studied as a function of nanostructure density, alignment, and composition. Field distributions are also shown to represent the preliminary results.
Keywords
Monte Carlo methods; dielectric materials; integral equations; nanostructured materials; stochastic processes; surface enhanced Raman scattering; Monte Carlo method; SERS substrates; dense nanostructures; far-field observables; field distributions; method of moments; nanoscale dielectric scatterers; nanostructure alignment; nanostructure array; nanostructure composition; nanostructure density; near-field observables; optical scattering; periodic kernel; randomly-oriented nanostructures; stochastic experiments; surface enhanced Raman spectroscopy; volume integral equation; Dielectric substrates; Integral equations; Kernel; Moment methods; Nanostructures; Optical arrays; Optical scattering; Raman scattering; Spectroscopy; Stochastic processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
Conference_Location
Charleston, SC
ISSN
1522-3965
Print_ISBN
978-1-4244-3647-7
Type
conf
DOI
10.1109/APS.2009.5171941
Filename
5171941
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