• DocumentCode
    2652132
  • Title

    A low-noise CMOS readout circuit at low frequency for MEMS capacitive accelerometers

  • Author

    Chen, Jianghua ; Ni, Xuewen ; Mo, Bangxian

  • Author_Institution
    Sch. of Inf. Sci. & Eng., Shandong Univ., Jinan, China
  • fYear
    2009
  • fDate
    20-23 Oct. 2009
  • Firstpage
    313
  • Lastpage
    316
  • Abstract
    This paper describes a low-noise CMOS readout circuit for MEMS capacitive accelerometers at low frequency. It cancels the input parasitic capacitance and the offset by a combination of switches. The raised current IDS of the input differential pair in the first stage helps reduce sharply the total low-frequency noises without increasing the complexity of the proposed circuit. The switched-capacitor low-pass filter with adjustable bandwidth can eliminate noises and interferences outside its bandwidth, and save chip area at low frequency. The simulation result of the proposed circuit shows that an average 60% noise reduction at low frequency has been achieved when the current in the current source of the first stage is six times larger than the original. The root mean square equivalent input noise voltage is about 6.1nV/rtHz@1kHz. The experimental result shows that the capacitance resolution of the whole CMOS readout circuit is 11aF/rtHz@1kHz.
  • Keywords
    CMOS integrated circuits; accelerometers; microsensors; microswitches; MEMS capacitive accelerometers; circuit complexity; input parasitic capacitance; low-noise CMOS readout circuit; noise elimination; root mean square equivalent input noise voltage; switched-capacitor low-pass filter; switches; total low-frequency noises; Accelerometers; Bandwidth; Circuit noise; Frequency; Interference elimination; Low pass filters; Low-frequency noise; Micromechanical devices; Parasitic capacitance; Switches; CMOS; accelerometer; low-noise; microelectromechanical systems (MEMS); readout circuit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2009. ASICON '09. IEEE 8th International Conference on
  • Conference_Location
    Changsha, Hunan
  • Print_ISBN
    978-1-4244-3868-6
  • Electronic_ISBN
    978-1-4244-3870-9
  • Type

    conf

  • DOI
    10.1109/ASICON.2009.5351441
  • Filename
    5351441