• DocumentCode
    2652524
  • Title

    Improved parameter extraction procedures for the R3 model

  • Author

    McAndrew, Colin C. ; Bettinger, Tamara

  • Author_Institution
    Freescale Semicond., Tempe, AZ, USA
  • fYear
    2011
  • fDate
    4-7 April 2011
  • Firstpage
    43
  • Lastpage
    48
  • Abstract
    This paper presents improved extraction algorithms for parameters of the R3 resistor model. For poly resistors we show how the depletion pinching parameters can be computed so that there are no numerical problems. For diffused resistors we provide a data analysis procedure that enables robust estimation of the depletion pinching parameters in the presence both of measurement noise and of velocity saturation or self-heating effects, and show that self-heating can be significantly more important than velocity saturation even for diffused resistors.
  • Keywords
    data analysis; integrated circuit modelling; thin film resistors; R3 resistor model; data analysis; depletion pinching parameters; diffused resistors; measurement noise; parameter extraction; poly resistors; robust estimation; self-heating effects; velocity saturation; Data models; Immune system; Junctions; Resistors; Robustness; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on
  • Conference_Location
    Amsterdam
  • ISSN
    1071-9032
  • Print_ISBN
    978-1-4244-8526-0
  • Electronic_ISBN
    1071-9032
  • Type

    conf

  • DOI
    10.1109/ICMTS.2011.5976858
  • Filename
    5976858