DocumentCode
2652725
Title
DTULive: functional digital programming environment
Author
Meunier, Franklin ; Puzio, G.
Author_Institution
Integrated Test Solutions, Springfield, MA, USA
fYear
2000
fDate
2000
Firstpage
181
Lastpage
183
Abstract
As the cost and complexity of digital test programs have been increasing exponentially with the level of integration, new, move effective methods of developing test programs must be used to develop effective tests. This paper presents an overview of a new product, DTULive, that provides a functional, non-simulation, test programming environment for complex circuit cards
Keywords
automatic test software; digital circuits; electronic engineering computing; printed circuit testing; programming environments; DTULive; complex circuit cards; digital test programs; functional digital programming environment; nonsimulation test programming environment; test program development; Circuit simulation; Circuit testing; Contracts; Costs; Digital circuits; Hardware; Manufacturing; Programming environments; Programming profession; Reverse engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location
Anaheim, CA
ISSN
1080-7725
Print_ISBN
0-7803-5868-6
Type
conf
DOI
10.1109/AUTEST.2000.885587
Filename
885587
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