• DocumentCode
    2652918
  • Title

    Singularity structure analysis for nonlinear dynamic systems

  • Author

    Tsao, Yuan-ying

  • Author_Institution
    Dept. of Electr. Eng., Drexel Univ., Philadelphia, PA, USA
  • fYear
    1990
  • fDate
    1-3 May 1990
  • Firstpage
    1458
  • Abstract
    The aim of this work is to develop an explicit system model which can characterize the system behavior in both the linear and nonlinear range. Fractal concepts and system theory are applied to develop the system model and the analytical methodology necessary to study the nonlinear behavior. The singularity structure model, which is a rational function with densely distributed singularities following a geometric sequence in the S-plane, has been developed for the analysis of relaxation processes in the linear range. The perturbation-dependent singularity structure is then used to model the nonlinear system in the time and frequency domain. An extended convolution method is proposed for analyzing the nonlinear behavior using the proposed system model. The physical system studied in this work is the electrode-electrolyte interface, and a high-precision measurement instrument has been used for observation. computational software has been developed to generate the simulated data. Both the model and the analysis method have been tested using experimental data collected in the linear and nonlinear ranges
  • Keywords
    frequency-domain analysis; nonlinear systems; time-domain analysis; S-plane; densely distributed singularities; electrode-electrolyte interface; experimental data; explicit system model; extended convolution method; fractal concepts; frequency domain; linear range; nonlinear dynamic systems; nonlinear range; perturbation-dependent singularity structure; simulated data; singularity structure analysis; singularity structure model; system theory; Analytical models; Computer interfaces; Convolution; Fractals; Frequency domain analysis; Instruments; Nonlinear dynamical systems; Nonlinear systems; Software measurement; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1990., IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Type

    conf

  • DOI
    10.1109/ISCAS.1990.112407
  • Filename
    112407