Test engineering education: a guide to a successful curriculum

Author

Ungar, Louis Y.

Author_Institution

A.T.E. Solutions Inc., El Segundo, CA, USA

fYear

2000

fDate

2000

Firstpage

273

Lastpage

283

Abstract

An extensive curriculum in test engineering was presented to approximately 20 beginning and intermediate engineers with Bachelors and Masters degrees in Electrical and Electronics Engineering. Over a period of 33 weeks these engineers were taught the rigors of test engineering, including such subjects as Test Program Set (TPS) Development, ATLAS, Building an ATE, Instrumentation and ATE Architecture, the VXIbus, Software Test, Quality Assurance, Design for Testability, Built-In Self Test, Integrated Diagnostics and Artificial Intelligence in Test, Electromagnetic Compatibility (EMC), and nonmental Testing. Graduates immediately began to develop TPSs for F-16 Avionics circuit card assemblies. This work involved re-hosting many of the TPSs. The performance of these graduates at their job is used as one of the evaluating factor for the success of the curriculum. Comments from instructors are also included. Finally a cost benefit analysis is given to evaluate the cost-effectiveness of TPS training

Keywords

automatic test equipment; automatic test software; built-in self test; design for testability; educational courses; electrical engineering education; printed circuit testing; quality control; systems engineering; ATE Architecture; ATLAS; Artificial Intelligence; Bachelors degrees; Built-In Self Test; Design for Testability; Electrical and Electronics Engineering; Electromagnetic Compatibility; F-16 Avionics; Integrated Diagnostics; Masters degrees; Quality Assurance; TPS training; Test Program Set Development; VXIbus; circuit card assemblies; cost benefit analysis; education; re-hosting; test engineering; Automatic testing; Buildings; Circuit testing; Computer architecture; Design engineering; Electromagnetic compatibility; Electronic equipment testing; Engineering education; Instruments; Software testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON Proceedings, 2000 IEEE

Conference_Location

Anaheim, CA

ISSN

1080-7725

Print_ISBN

0-7803-5868-6

Type

conf

DOI

10.1109/AUTEST.2000.885603

Filename

885603