• DocumentCode
    2653157
  • Title

    Visual testing software environment using object-oriented programming

  • Author

    Dai, Junguang ; Chen, Guangju

  • Author_Institution
    Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    328
  • Lastpage
    333
  • Abstract
    Object-oriented programming is an alternative to deal with the problems associated in the development, maintenance and update of large software for measurement applications. But many applications in the computer-automated testing system depend critically on the simplicity, flexibility and efficiency of the implementation. This paper is about the object-oriented approach to solve the problem of the testing software development. A decomposition of the visual testing software environment into classes, suitable to include all elements required in this development, is presented. The internal structure of the object-oriented program, developed in C++, is discussed. A radar test system and a high-speed and multichannel data acquisition system are implemented in that environment successfully
  • Keywords
    C++ language; automatic test equipment; automatic test software; data acquisition; graphical user interfaces; object-oriented programming; program visualisation; programming environments; radar equipment; software maintenance; virtual instrumentation; C++ program; computer-automated testing system; conceptual models; data class; decomposition into classes; execution flow; high-speed multichannel DAQ system; instrument class; line class; object-oriented programming; program visualisation; radar test system; software development; software maintenance; software update; test development window; visual testing software environment; Application software; Automatic testing; Computer applications; Joining processes; Object oriented modeling; Object oriented programming; Software maintenance; Software measurement; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2000 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5868-6
  • Type

    conf

  • DOI
    10.1109/AUTEST.2000.885609
  • Filename
    885609