DocumentCode
2653367
Title
IEEE 1232 and P1522 standards
Author
Sheppard, John ; Kaufman, Mark
Author_Institution
ARINC Res. Corp., Annapolis, MD, USA
fYear
2000
fDate
2000
Firstpage
388
Lastpage
397
Abstract
The 1232 family of standards were developed to provide standard exchange formats and software services for reasoning systems used in system test and diagnosis. The exchange formats and services am based on a model of information required to support test and diagnosis. The standards were developed by the Diagnostic and Maintenance Control (D&MC) subcommittee of IEEE SCC20. The current efforts by the D&MC are a combined standard made up of the 1232 family, and a standard on Testability and Diagnosability Metrics, P1522. The 1232 standards describe a neutral exchange format so one diagnostic reasoner can exchange model information with another diagnostic reasoner. In addition, software interfaces are defined whereby diagnostic tools can be developed to process the diagnostic information in a consistent and reliable way. The objective of the Testability and Diagnosability Metrics standard is to provide notionally correct and mathematically precise definitions of testability measures that may be used to either measure the testability characteristics of a system, or predict the testability of a system. The end purpose is to provide an unambiguous source for definitions of common and uncommon testability and diagnosability terms such that each individual encountering it can know precisely what that term means. This paper describes the 1232 and P1522 standards and details the recent changes in the Information models, restructured higher order services and simplified conformance requirements
Keywords
IEEE standards; automatic test software; diagnostic expert systems; diagnostic reasoning; fault diagnosis; software standards; IEEE 1232 standards; IEEE SCC20 subcommittee; Information models; P1522 standards; conformance; diagnosability; diagnosis; reasoning systems; software interfaces; standard exchange formats; standard software; system test; testability characteristics; Computer aided manufacturing; Databases; Design automation; Measurement standards; Software standards; Software tools; Standards development; Standards organizations; Standards publication; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location
Anaheim, CA
ISSN
1080-7725
Print_ISBN
0-7803-5868-6
Type
conf
DOI
10.1109/AUTEST.2000.885619
Filename
885619
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