• DocumentCode
    2653385
  • Title

    Beyond time optimal performance using SIMO DC-DC converters in dynamic voltage scaling

  • Author

    Kapat, Santanu

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India
  • fYear
    2015
  • fDate
    15-19 March 2015
  • Firstpage
    404
  • Lastpage
    409
  • Abstract
    Dynamic voltage scaling (DVS) is an useful technique to optimize performance and efficiency of CMOS digital processors using DC-DC converters that require to meet extremely fast slew rate demand. This paper formulates time optimal performance of existing buck-derived DVS architectures, such as using (a) a synchronous buck converter, (b) a multi-phase buck converter, and (c) multiple dedicated buck converter topologies. Thereafter, time optimal performance is formulated using a single-inductor-multiple-output (SIMO) buck converter based DVS architecture. It is shown that a SIMO-derived DVS architecture can achieve performance much beyond system physical limits of that using existing architectures for a step-change in the reference voltage and/or the load current. The proposed architecture and existing power converter architectures are fabricated, and time optimal control is implemented using an FPGA device. Test results demonstrate significant reduction in time and energy overheads using the proposed DVS architecture.
  • Keywords
    CMOS digital integrated circuits; DC-DC power convertors; field programmable gate arrays; inductors; phase convertors; CMOS digital processor; FPGA device; SIMO DC-DC converter; beyond time optimal performance; buck-derived DVS architecture; dynamic voltage scaling; multiphase buck converter; multiple dedicated buck converter topology; single-inductor-multiple-output system; slew rate demand; synchronous buck converter; Inductors; Program processors; Switches; Topology; Transient analysis; Transient response; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
  • Conference_Location
    Charlotte, NC
  • Type

    conf

  • DOI
    10.1109/APEC.2015.7104382
  • Filename
    7104382