DocumentCode :
2653742
Title :
VXI synchro/resolver and phase-angle voltmeter COTS resources for F-15 AADTS program ATE
Author :
Johnson, Michael W.
Author_Institution :
NAI Inc., Bohemia, NY, USA
fYear :
2000
fDate :
2000
Firstpage :
554
Lastpage :
558
Abstract :
This paper describes the Technology Inc (MTI) F-15 AADTS (Analog Avionic Depot Test Station) system and the two NAI, Inc VXI Commercial-Off-The-Shelf (COTS) resource cards it uses: the synchro/resolver simulation and measurement card and the phase-angle voltmeter card. The MTI AADTS ATE system incorporates an open architecture VXIbus-based and GPIB-based design for test and maintenance of F-15 analog circuit cards. It´s an upgrade and refurbishment of an older system, designed to allow old test programs and old test adapters to run on it. All of the instruments in the tester are Commercial-Off-The-Shelf (COTS) units, including the NAI Model 5388 synchro/resolver resource and Model 227 phase-angle voltmeter. NAI´s model 5388 is a C size VXI COTS Synchro-Resolver Simulation and Angle Position Measurement card. Interfacing to rugged reliable synchros, the 5388 functionality is based upon highly accurate synchro-to-digital conversion and digital-to-synchro simulation. NAI´s model 227 is a wideband message-based phase-angle voltmeter, utilizing the latest DSP technology to provide high performance phase-sensitive, frequency selective voltage measurements. The phase-sensitive measurements of in-phase and quadrature voltage, as well as phase angle, can be made at any frequency from 10 Hz to 100 kHz
Keywords :
aircraft testing; automatic test equipment; military aircraft; military avionics; peripheral interfaces; printed circuit testing; voltmeters; 10 Hz to 100 kHz; Analog Avionic Depot Test Station; COTS resources; DSP technology; F-15 AADTS program ATE; GPIB-based design; NAI; VXI synchro/resolver; VXIbus-based design; analog circuit cards; digital-to-synchro simulation; frequency selective voltage measurements; in-phase voltage; open architecture; phase-angle voltmeter; phase-sensitive measurements; quadrature voltage; synchro-to-digital conversion; Aerospace electronics; Analog circuits; Circuit simulation; Circuit testing; Frequency; Instruments; Phase measurement; Position measurement; System testing; Voltmeters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1080-7725
Print_ISBN :
0-7803-5868-6
Type :
conf
DOI :
10.1109/AUTEST.2000.885639
Filename :
885639
Link To Document :
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