• DocumentCode
    2653742
  • Title

    VXI synchro/resolver and phase-angle voltmeter COTS resources for F-15 AADTS program ATE

  • Author

    Johnson, Michael W.

  • Author_Institution
    NAI Inc., Bohemia, NY, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    554
  • Lastpage
    558
  • Abstract
    This paper describes the Technology Inc (MTI) F-15 AADTS (Analog Avionic Depot Test Station) system and the two NAI, Inc VXI Commercial-Off-The-Shelf (COTS) resource cards it uses: the synchro/resolver simulation and measurement card and the phase-angle voltmeter card. The MTI AADTS ATE system incorporates an open architecture VXIbus-based and GPIB-based design for test and maintenance of F-15 analog circuit cards. It´s an upgrade and refurbishment of an older system, designed to allow old test programs and old test adapters to run on it. All of the instruments in the tester are Commercial-Off-The-Shelf (COTS) units, including the NAI Model 5388 synchro/resolver resource and Model 227 phase-angle voltmeter. NAI´s model 5388 is a C size VXI COTS Synchro-Resolver Simulation and Angle Position Measurement card. Interfacing to rugged reliable synchros, the 5388 functionality is based upon highly accurate synchro-to-digital conversion and digital-to-synchro simulation. NAI´s model 227 is a wideband message-based phase-angle voltmeter, utilizing the latest DSP technology to provide high performance phase-sensitive, frequency selective voltage measurements. The phase-sensitive measurements of in-phase and quadrature voltage, as well as phase angle, can be made at any frequency from 10 Hz to 100 kHz
  • Keywords
    aircraft testing; automatic test equipment; military aircraft; military avionics; peripheral interfaces; printed circuit testing; voltmeters; 10 Hz to 100 kHz; Analog Avionic Depot Test Station; COTS resources; DSP technology; F-15 AADTS program ATE; GPIB-based design; NAI; VXI synchro/resolver; VXIbus-based design; analog circuit cards; digital-to-synchro simulation; frequency selective voltage measurements; in-phase voltage; open architecture; phase-angle voltmeter; phase-sensitive measurements; quadrature voltage; synchro-to-digital conversion; Aerospace electronics; Analog circuits; Circuit simulation; Circuit testing; Frequency; Instruments; Phase measurement; Position measurement; System testing; Voltmeters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2000 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5868-6
  • Type

    conf

  • DOI
    10.1109/AUTEST.2000.885639
  • Filename
    885639