• DocumentCode
    2653866
  • Title

    Bridging the gap [between low-cost general purpose electronic test equipment and high cost ATE]

  • Author

    Webb, Tim

  • Author_Institution
    DiagnoSYS Inc., Kissimmee, FL, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    614
  • Lastpage
    620
  • Abstract
    This paper takes a look at some of the more common methods being used for circuit card test and repair. Examining the high and low end techniques, prepares the way to explore mid-range capabilities that can augment both. For the most part circuit card repair is carried out using low cost General Purpose Electronic Test Equipment (GPETE) or high cost Automatic Test Equipment (ATE) utilizing Test Program Sets (TPS). Whereas both methods have their advantages they leave a gap between the technologies used and the practical aspect. This paper, highlights an alternative method being adopted by various branches of the US government to increase the repair capabilities within the military
  • Keywords
    automatic test equipment; printed circuit testing; test equipment; ATE; automatic test equipment; circuit card repair; circuit card test; general purpose electronic test equipment; mid-range capabilities; test program sets; Automatic test equipment; Automatic testing; Circuit testing; Costs; Electronic equipment testing; Government; Life testing; Performance evaluation; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2000 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5868-6
  • Type

    conf

  • DOI
    10.1109/AUTEST.2000.885648
  • Filename
    885648