DocumentCode
2653940
Title
Robotically enhanced LASAR guided probe
Author
Chirnitch, J.
Author_Institution
BCO Inc., Billerica, MA
fYear
2000
fDate
2000
Firstpage
644
Lastpage
653
Abstract
Guided probe testing is the method of choice for troubleshooting complex digital circuit cards. Programs require certain time dependent and manual operations that can vary in length, add complexity and introduce errors. This results in increased time to isolate faults and the need for retest due to introduction of errors by human operators. Adding robotics has the potential to speed-up the process, reduce errors and increase efficiency. Complex CCA´s with multiple fan-in´s, may require many probings to isolate faults. The process frequently becomes tedious and repetitious. The operator must be especially alert to faithfully follow probe instructions, but occasionally he may probe incorrect test points, or apply insufficient pressure to make contact. Introduction of a robotic prober allows the process to: become fully automated, provide added reliability and improve efficiency. Tests have demonstrated an average 17:1 reduction in probing time and elimination of the need for a human operator. With simple changes in the Teradyne software, and inclusion of a robotics algorithm, test programs have been successfully implemented to utilize a robotic prober. Results have demonstrated: increased reliability, significant improvement in probing time, elimination of retest, uniform probe pressure and a fully automated diagnostic process
Keywords
automatic test equipment; fault diagnosis; industrial robots; printed circuit testing; probes; CCA; Teradyne software; automated diagnostic process; digital circuit cards; probing time; reliability; robotically enhanced lasar guided probe; test points; uniform probe pressure; Circuit faults; Circuit testing; Digital circuits; Humans; Manuals; Probes; Robotics and automation; Robots; Software algorithms; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2000 IEEE
Conference_Location
Anaheim, CA
ISSN
1080-7725
Print_ISBN
0-7803-5868-6
Type
conf
DOI
10.1109/AUTEST.2000.885652
Filename
885652
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