Title :
An Analytical Framework for Performance Analysis of UWB Systems in Log-Normal Multipath Channels via Pearson Type IV Distribution
Author :
Di Renzo, Marco ; Graziosi, Fabio ; Santucci, Fortunato
Author_Institution :
Dept. of Electr. & Inf. Eng., DEWS, l´´Aquila
Abstract :
In this paper, we propose an analytical framework for the accurate analysis of Rake and transmitted reference (TR) ultra wide band (UWB) receivers in multipath channels with log-normal fading. The framework relies on approximating the logarithm of the signal-to-noise ratio (SNR) at the detector input by the Pearson type IV distribution, which turns out to provide a simple but surprisingly effective and accurate approximation for the whole SNR probability density function (pdf). The framework includes the analytical derivation of i) the average bit error probability (ABEP) via Gauss-Legendre Gaussian quadrature rules (GQR), ii) the SNR cumulative distribution function (CDF) via the hypergeometric function 2F1 (middot, middot; middot; middot), which is useful for outage probability (Pout) analysis and iii) the SNR moment generating function (MGF) via Gauss-Legendre GQR. The validity and accuracy of the theoretical approach are also substantiated via Monte Carlo simulations.
Keywords :
Gaussian processes; Monte Carlo methods; error statistics; fading channels; multipath channels; radio receivers; ultra wideband communication; Gauss-Legendre Gaussian quadrature rules; Monte Carlo simulations; Pearson type IV distribution; Rake receivers; SNR cumulative distribution function; SNR moment generating function; UWB systems; average bit error probability; hypergeometric function; log-normal fading; log-normal multipath channels; probability density function; signal-to-noise ratio; transmitted reference; ultra wide band receivers; Detectors; Error probability; Fading; Gaussian distribution; Multipath channels; Performance analysis; Probability density function; RAKE receivers; Signal to noise ratio; Ultra wideband technology;
Conference_Titel :
Vehicular Technology Conference, 2007. VTC2007-Spring. IEEE 65th
Conference_Location :
Dublin
Print_ISBN :
1-4244-0266-2
DOI :
10.1109/VETECS.2007.326