• DocumentCode
    265435
  • Title

    Investigations on stability of implanted nervous thin-film electrodes

  • Author

    Cvancara, P. ; Boretius, T. ; Stieglitz, T.

  • Author_Institution
    Lab. for Biomed. Microtechnol., Univ. of Freiburg, Freiburg, Germany
  • fYear
    2014
  • fDate
    17-19 Sept. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Many micromachined neural implants with multi-channel thin-film electrodes have been presented over the last decades. A transverse intrafascicular multi-channel electrode (TIME) was developed for translational research to treat phantom limb pain (PLP). Four TIME systems (latest electrode version) have been implanted for 30 days into the arm of an amputee. After finishing successfully the clinical trials the TEVIE-3H systems have been explanted. The material composition of the electrode contacts used for stimulation have been investigated with X-ray photoelectron spectroscopy (XPS). System integrity has been examined using focused ion beam (FIB) and pictures were acquired using the integrated scanning electron microscope (SEM). Both methods revealed that the metallization was still intact after explantation and that no delamination occurred. Crack formation without delamination was observed but it could not be determined if it originated while the implant was inside the body or during the explantation or during the cleaning of the implants.
  • Keywords
    X-ray photoelectron spectra; biomedical electrodes; cracks; focused ion beam technology; micromachining; neurophysiology; phantoms; prosthetics; scanning electron microscopy; FIB; PLP; SEM; TIME-3H systems; X-ray photoelectron spectroscopy; XPS; crack formation; focused ion beam; implanted nervous thin-film electrode stability; integrated scanning electron microscopy; material composition; metallization; micromachined neural implants; multichannel thin-film electrodes; phantom limb pain; transverse intrafascicular multichannel electrode; Ceramics; Clinical trials; Delamination; Electrodes; Metallization; Platinum; Scanning electron microscopy; FIB; Polyimide; SIROF; TIME; XPS; thin-film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Functional Electrical Stimulation Society Annual Conference (IFESS), 2014 IEEE 19th International
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4799-6482-6
  • Type

    conf

  • DOI
    10.1109/IFESS.2014.7036747
  • Filename
    7036747