• DocumentCode
    2654404
  • Title

    DM-SIMD: A new SIMD predication mechanism for exploiting superword level parallelism

  • Author

    Huang, Libo ; Shen, Li ; Ma, Sheng ; Xiao, Nong ; Wang, Zhiying

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
  • fYear
    2009
  • fDate
    20-23 Oct. 2009
  • Firstpage
    863
  • Lastpage
    866
  • Abstract
    Predication mechanism is a promising architectural feature for exploiting superword level parallelism (SLP) in presence of control flow. However, for the sake of binary compatibility, current SIMD extension only supports partial predicated execution such as select method which has performance and safety problems. In this paper, we present a new SIMD predication mechanism, data masked SIMD (DM-SIMD), capable of supporting full predication without touching existing ISA. DM-SIMD avoids the high encoding overhead of traditional full predication, and eliminates safety problem raised by partial predication as well. The cornerstone of this mechanism is the ¿state change¿ idea which adds new instructions to set internal state in SIMD datapath rather than putting the VM setting bits in every SIMD instruction. To effectively use DM-SIMD facilities for SIMD code generation, the compilation strategies are also proposed. We implemented these techniques in a vectorizing compiler and experiments were conducted on various kinds of applications. The results show that performance speedup, about 20% higher than current SIMD extensions, can be achieved.
  • Keywords
    microprocessor chips; parallel processing; DM-SIMD; SIMD instruction; SIMD predication mechanism; data masked SIMD; state change; superword level parallelism; Computer aided instruction; Electric breakdown; Encoding; Instruction sets; Microprocessors; Parallel processing; Process design; Safety; Size control; Virtual manufacturing; SIMD; SLP; control flow; full predication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2009. ASICON '09. IEEE 8th International Conference on
  • Conference_Location
    Changsha, Hunan
  • Print_ISBN
    978-1-4244-3868-6
  • Electronic_ISBN
    978-1-4244-3870-9
  • Type

    conf

  • DOI
    10.1109/ASICON.2009.5351559
  • Filename
    5351559