DocumentCode
2654913
Title
A PO-MoM comparison for electrically large dielectric geometries
Author
Meana, J.G. ; Martinez-Lorenzo, Jose Angel ; Rappaport, C. ; Las-Heras, F.
Author_Institution
Univ. of Oviedo, Gijon, Spain
fYear
2009
fDate
1-5 June 2009
Firstpage
1
Lastpage
4
Abstract
This paper presents a comparison between PO and full wave RCS results for dielectric scattering geometries. The dihedral example shows good agreement when computing reflections, with the second contribution being the most important for the monostatic simulation. Secondly, the bistatic RCS of a larger geometry consisting of a rough surface with Gaussian incidence for PO and SDFMM shows great coincidence in the main lobe, while the reflection near grazing directions degrades for PO as expected. As a consequence, the modified PO successfully models problems which may be prohibitive for full-wave simulation.
Keywords
Gaussian processes; X-ray optics; method of moments; physical optics; radar cross-sections; Gaussian incidence; PO-MoM comparison; computing reflections; dielectric scattering geometries; full wave RCS; method of moments; monostatic simulation; physical optics; radar cross-sections; reflection near grazing directions; steepest descendent fast multipole method; Brain modeling; Dielectric losses; Electromagnetic scattering; Geometry; Optical reflection; Optical scattering; Optical surface waves; Radar scattering; Rough surfaces; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
Conference_Location
Charleston, SC
ISSN
1522-3965
Print_ISBN
978-1-4244-3647-7
Type
conf
DOI
10.1109/APS.2009.5172142
Filename
5172142
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