Title :
T2- TAM:Reusing infrastructure resource to provide parallel testing for NoC based Chip
Author :
Fu, Binzhang ; Han, Yinhe ; Li, Huawi ; Li, Xiaowei
Author_Institution :
Key Lab. of Comput. Syst. & Archit., Grad. Univ. of Chinese Acad. of Sci., Beijing, China
Abstract :
Reusing network-on-chip (NoC) as test-access-mechanism (TAM) has been adopted to transfer test data to embedded cores. However, an observation shows that compared to NoC-reuse TAM, some bus-based TAM are able to achieve better results in test time due to its fine-grained scheduling unit. This paper proposed a new TAM named Test Tree(T2). T2TAM could be built by reusing the hardware resources of routers instead of reusing the packet-based NoC. Though implementing DFT design on routers, the T2TAM can achieve wire utilization and adopts fine-grained basic scheduling. Besides, to address the problem of testing large number of homogeneous cores, T2-TAM is proposed to facilitate multicasting stimuli to homogeneous cores to save test time. Experimental results show that the test cycles could be reduced up to 38% in comparison with the work reusing NoC as TAM with only 0.3% DFT overhead.
Keywords :
embedded systems; network-on-chip; telecommunication network routing; embedded cores; fine-grained basic scheduling; fine-grained scheduling unit; infrastructure resource; packet-based network-on-chip; parallel testing; routers; test access mechanism; wire utilization; Design for testability; Hardware; Network-on-a-chip; Payloads; Protocols; Rails; Scheduling algorithm; Tail; Testing; Wires; DFT; Network-On-Chip; Test-Access-Mechanism;
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
DOI :
10.1109/ASICON.2009.5351598