DocumentCode
2656190
Title
Comparison between sets of synthetic basis functions based on different generating processes
Author
Casaletti, M. ; Maci, S. ; Vecchi, G.
Author_Institution
Dept. of Inf. Eng., Univ. of Siena, Siena, Italy
fYear
2009
fDate
1-5 June 2009
Firstpage
1
Lastpage
4
Abstract
The conventional method of the moment (MoM) formulations have well-known limits to the problem size, because they lead to large, dense and sometimes ill-conditioned matrices. In order to overcome these problems, different schemes have been presented in literature. Among these schemes, we mention the family of methods that employ an "iteration free" approach, where standard (e.g. RWG) basis functions are aggregated into larger functions. This notably includes the synthetic function expansion (SFX) and the characteristic basis function (CBF) methods. These aggregate basis functions are defined from the solution of smaller-size numerically-tractable problems, excited by appropriate sources, and then used in the MoM solution of the large problem. Thousand of wavelength structures can be treated with memory and CPU cost provided by a standard personal computer. In this paper we make a comparison between aggregated functions obtained for treat large portions of PEC planar objects containing edges (special cases include geometries with large polyhedral sub-surfaces) obtained by using different excitation sources.
Keywords
electromagnetic waves; iterative methods; method of moments; PEC planar objects; aggregated functions; characteristic basis function method; iteration free approach; method of the moment; standard personal computer; synthetic function expansion method; wavelength structures; Aggregates; Costs; Current distribution; Diffraction; Geometry; Green´s function methods; Microcomputers; Polarization; Surface treatment; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
Conference_Location
Charleston, SC
ISSN
1522-3965
Print_ISBN
978-1-4244-3647-7
Type
conf
DOI
10.1109/APS.2009.5172211
Filename
5172211
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