DocumentCode
2656591
Title
Multi-port ESD protection using bi-directional SCR structures
Author
Vaschenko ; Concannon, A. ; Beek, M. Ter ; Hopper, P.
Author_Institution
Nat. Semicond. Corp., Santa Clara, CA, USA
fYear
2003
fDate
28-30 Sept. 2003
Firstpage
137
Lastpage
140
Abstract
A novel approach for the ESD protection of analog circuits using a pad-to-pad network is proposed and validated by numerical simulation and experimental data. The network is formed by inter-linked bi-directional SCR´s. This network provides a space saving solution to the requirement for providing ESD protection for arbitrary pin-to-pin combinations, and is especially attractive for small analog circuits in bipolar and BiCMOS technologies.
Keywords
BiCMOS analogue integrated circuits; bipolar analogue integrated circuits; electrostatic discharge; integrated circuit reliability; integrated circuit testing; thyristors; BiCMOS; analog circuits; arbitrary pin-to-pin combinations; bidirectional SCR structures; bipolar technology; inter-linked bidirectional SCR; multiport ESD protection; numerical simulation; pad-to-pad network; silicon controlled rectifier; BiCMOS analog integrated circuits; Bipolar analog integrated circuits; Electrostatic discharges; Integrated circuit reliability; Integrated circuit testing; Thyristors;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting, 2003. Proceedings of the
ISSN
1088-9299
Print_ISBN
0-7803-7800-8
Type
conf
DOI
10.1109/BIPOL.2003.1274953
Filename
1274953
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