DocumentCode :
2657306
Title :
Silver migration control in electrically conductive adhesives
Author :
Li, Yi ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA
fYear :
2006
fDate :
27-28 June 2006
Firstpage :
206
Lastpage :
212
Abstract :
Although conductive adhesives have been studied for many years as a lead-free alternative in electronic industry, applications of electrically conductive adhesives (ECAs) for electronic interconnect are limited to low voltage display driver devices. This is due to the serious concerns associated with the long-term reliability and high voltage application issues caused by the silver migration. In this study, a novel approach to reduce silver migration and enhance the long-term reliability of conductive adhesives is discovered by using self-assembled monolayer molecular wires. The approach enhances the long-term reliability and durability of conductive adhesives and enables the ECA for high voltage applications. In addition, the self-assembled molecular wires help the dispersion of conductive fillers (in particular, nano-sized (<100 nm) conductive fillers) in the polymer matrix and enhance the electrical conductivity of conductive adhesives. Due to the high current density of those functional molecular monolayers, the current carrying capability of conductive adhesives can also be improved significantly
Keywords :
conductive adhesives; display devices; electrical conductivity; filler metals; monolayers; reliability; self-assembly; conductive fillers; display driver devices; electrical conductivity; electrically conductive adhesives; electronic interconnects; electronics industry; self-assembled monolayer molecular wires; silver migration; Conductive adhesives; Displays; Driver circuits; Electronics industry; Environmentally friendly manufacturing techniques; Industrial electronics; Low voltage; Self-assembly; Silver; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0488-6
Type :
conf
DOI :
10.1109/HDP.2006.1707594
Filename :
1707594
Link To Document :
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