Precision test fixture for measuring equivalent circuit parameters of GHz surface-mounted quarts crystal units

Author

Wada, Manabu ; Watanabe, Yasuaki ; Sakuta, Yukinori ; Hattori, Masashi ; Takahashi, Osamu

Author_Institution

Nihon Dempa Kogyo, Saitama, Japan

fYear

2012

fDate

21-24 May 2012

Firstpage

1

Lastpage

3

Abstract

We developed a coaxial-type fixture for precisely measurement of the impedance characteristics of small surface-mounted quartz crystal units. This fixture is applicable to the one-port S-parameter reflection method proposed in IEC60444-5, and measures the frequency impedance characteristics of a device under test (DUT) from its reflection coefficients. This measurement fixture uses a 65 GHz coaxial connector and calibrators with a 1.85 mm inside diameter. Using a “zero-length” coaxial center pin method, this fixture can be applied to up to 2 GHz devices without the need for electrical length compensation.

Keywords

IEC standards; S-parameters; circuit testing; crystal resonators; electric impedance measurement; equivalent circuits; frequency measurement; millimetre wave circuits; millimetre wave measurement; DUT; GHz surface-mounted quarts crystal units; IEC60444-5; coaxial connector; coaxial-type fixture; device under test; equivalent circuit parameter measurement; frequency 65 GHz; frequency impedance characteristic measurement; one-port S-parameter reflection method; precision test fixture; surface-mounted quartz crystal units; zero- length coaxial center pin method; Crystals; Electrical resistance measurement; Fixtures; Frequency measurement; Impedance; Reflection; Resonant frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium (FCS), 2012 IEEE International

Conference_Location

Baltimore, MD

ISSN

1075-6787

Print_ISBN

978-1-4577-1821-2

Type

conf

DOI

10.1109/FCS.2012.6243599

Filename

6243599