Design automation of test for the ES/9000 series processors

Author

Keller, Brion L. ; Haynes, David A.

Author_Institution

IBM Corp., Endicott, NY, USA

fYear

1991

fDate

14-16 Oct 1991

Firstpage

550

Lastpage

553

Abstract

IBM tests each component, subassembly and system it manufactures in order to ensure that only a fully functioning, quality product is shipped to the customer. Most of the tests that are applied to these circuits are derived automatically by design automation software. This software has been developed and maintained over the last 20+ years by IBM´s Test Design Automation group in Endicott, New York. The recently announced ES/9000 processors all used this design automation support. In fact, some recently developed software for support of self testing circuits was developed specifically for these processors. An overview is given of this design automation support and the methodologies used to test the newly announced ES/9000 processors

Keywords

IBM computers; computer testing; mainframes; ES/9000 series processors; design automation of test; design automation software; self testing circuits; Automatic testing; Circuit faults; Circuit testing; Design automation; Design engineering; Logic testing; Manufacturing automation; Software testing; System testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on

Conference_Location

Cambridge, MA

Print_ISBN

0-8186-2270-9

Type

conf

DOI

10.1109/ICCD.1991.139970

Filename

139970