• DocumentCode
    2657670
  • Title

    The microstructure of eutectic Au-Sn and In-Sn solders on Au/Ti and Au/Ni metallizations during laser solder bonding process for optical fiber alignment

  • Author

    Bohan, Yan ; Chunqing, Wang ; Wei, Zhang

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Harbin Inst. of Technol.
  • fYear
    2006
  • fDate
    27-28 June 2006
  • Firstpage
    298
  • Lastpage
    303
  • Abstract
    In this work, two eutectic solders: 80Au20Sn and 52In48Sn were chosen for fiber bonding through laser soldering, and scanning electronic microscope (SEM) equipped with energy dispersive x-ray detector (EDX) was used to investigate the microstructures of at four interfaces between two solders and two metallizations: Au-Sn/(Au/Ti), Au-Sn/( Au/Ni), In-Sn/ (Au/Ti), In-Sn/(Au/Ni). Results show that as for the Au-Sn solder joint a large amount of zeta-phase was formed at the Au-Sn/(Au/Ti) interface with its morphology closely related with laser input energy; while at the Au-Sn/(Au/Ni) interface scallop-like (Au,Ni)Sn appeared with a low input energy and irregular-shaped (Au,Ni) 3Sn2 emerged with a high input energy. As for the In-Sn solder, the IMCs at the In-Sn/ (Au/Ti) interface transformed from a Au(In,Sn)2 layer to isolated Auln2 cubes with the increase of input energy while at the In-Sn/(Au/Ni) interface a thin layer of Au(In,Sn)2 was formed. As the connecting layer, Ti did not react in the soldering process
  • Keywords
    X-ray chemical analysis; eutectic alloys; eutectic structure; gold compounds; indium compounds; metallisation; scanning electron microscopy; solders; tin compounds; (AuNi)Sn; Au(InSn)2; Au-Ni; Au-Sn-Au-Ti; Au/Ni metallizations; Au/Ti metallizations; IMC; In-Sn-Au-Ti; energy dispersive x-ray detector; eutectic Au-Sn solders; eutectic In-Sn solders; fiber bonding; laser solder bonding; microstructure; optical fiber alignment; scanning electronic microscope; Bonding processes; Dispersion; Fiber lasers; Gold; Metallization; Microstructure; Optical fibers; Scanning electron microscopy; Soldering; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0488-6
  • Type

    conf

  • DOI
    10.1109/HDP.2006.1707610
  • Filename
    1707610