DocumentCode
2657711
Title
Failure analysis of the CdZnTe detector electrode contacts
Author
Jianyong, Teng ; Wenbin, Sang ; Kaifeng, Qin ; Jiahua, Min ; Jun, Xia
Author_Institution
Shanghai Univ.
fYear
2006
fDate
27-28 June 2006
Firstpage
308
Lastpage
310
Abstract
The characteristics of the Au contacts deposited by three different processes before and after accelerating aging tests have been investigated in this paper. The experimental results indicate that the aging tests can cause the degradation of the contact interfacial properties, such as continuities, adhesion strength and ohmic characteristics, especially for the contact interface deposited by the thermal vacuum processing, which would influence the performance of CdZnTe detectors
Keywords
ageing; cadmium compounds; failure analysis; particle detectors; zinc compounds; CdZnTe; CdZnTe detector; aging tests; contact interfacial properties; degradation; electrode contacts; failure analysis; thermal vacuum processing; Accelerated aging; Acoustic transducers; Acoustic waves; Electrodes; Failure analysis; Gold; Radiation detectors; Surface acoustic waves; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0488-6
Type
conf
DOI
10.1109/HDP.2006.1707612
Filename
1707612
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