DocumentCode :
2657989
Title :
An experimental study of NOx removal treatment on multiple photochemical reaction with Vacuum-Ultra-Violet light irradiation
Author :
Nakayama, T. ; Ohyama, R.
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokai Univ., Hiratsuka, Japan
fYear :
2010
fDate :
17-20 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
In this work, in order to investigate the NO removal based on a photochemical reaction, an application of Vacuum-Ultra-Violet (VUV) light irradiation from a xenon (Xe) discharge lamp to Diesel combustion exhaust gas treatments was experimentally conducted. Because N-O and NO-O binding energies (150 kcal/mol and 74 kcal/mol) were lower than the photon energy of 172 nm in wavelength, the VUV irradiation is corresponding to 165 kcal/mol in photon energy; the NO molecule was decomposed to N atom and O atom as a following under condition of the photon energy. The VUV irradiation intensity was decreased to 1% or less atmospheric condition by the photon traveling length of 20 mm. The processed molecules were NO removal and NO2 byproduct. The removal of NO2 byproduct was characterized by multiple irradiation of VUV light. The NO2 byproduct as the oxidizing reaction of NO was increased in and around area where the VUV light was irradiated.
Keywords :
air pollution; binding energy; diesel engines; discharge lamps; environmental factors; exhaust systems; nitrogen compounds; photochemistry; ultraviolet radiation effects; NOx removal treatment; VUV irradiation intensity; VUV light irradiation; diesel combustion exhaust gas treatment; multiple photochemical reaction; oxidizing reaction; photon energy; vacuum-ultra-violet light irradiation; xenon discharge lamp; Combustion; Diesel engines; Discharges; Inductors; Photonics; Radiation effects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
Conference_Location :
West Lafayette, IN
ISSN :
0084-9162
Print_ISBN :
978-1-4244-9468-2
Type :
conf
DOI :
10.1109/CEIDP.2010.5723934
Filename :
5723934
Link To Document :
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