DocumentCode :
2658117
Title :
Influence of automatic level control on micromechanical resonator oscillator phase noise
Author :
Lee, Seungbae ; Nguyen, Clark T -C
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear :
2003
fDate :
4-8 May 2003
Firstpage :
341
Lastpage :
349
Abstract :
Clear differences in the phase noise performance of a 10 MHz MEMS-based micromechanical resonator oscillator have been measured using sustaining circuits with and without automatic-level control (ALC), and with differing mechanisms for ALC. In particular, low output power oscillators referenced to high-Q clamped-clamped beam μmechanical resonators exhibit an unexpected 1/f3 phase noise component without ALC, a 1/f5 phase noise component when an ALC circuit based on resonator dc-bias adjustment is used, and finally, removal of these components when an ALC circuit based on sustaining amplifier gain control is used, in which case the expected 1/f2 phase noise component is all that remains. That ALC is able to remove the 1/f3 phase noise seen in non-ALC´ed oscillators suggests that this noise component emanates primarily from nonlinearity in the voltage-to-force capacitive transducer, either through direct aliasing of amplifier 1/f noise, or through instabilities introduced by spring softening (i.e., Duffing) phenomena.
Keywords :
1/f noise; gain control; micromechanical resonators; microwave oscillators; operational amplifiers; oscillators; phase noise; 1/f3 phase noise; 10 MHz; MEMS based micromechanical resonator oscillator phase noise; amplifier gain control; automatic level control; low output power oscillators; spring softening; voltage-force capacitive transducer; Automatic control; Automatic logic units; Circuits; Level control; Micromechanical devices; Noise measurement; Oscillators; Phase measurement; Phase noise; Power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-7688-9
Type :
conf
DOI :
10.1109/FREQ.2003.1275113
Filename :
1275113
Link To Document :
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