• DocumentCode
    2658239
  • Title

    Surface ageing of dielectric materials in a controlled atmosphere: A Raman microprobe study

  • Author

    Freebody, N.A. ; Vaughan, A.S.

  • Author_Institution
    Univ. of Southampton, Southampton, UK
  • fYear
    2010
  • fDate
    17-20 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper takes a novel approach to the problem of characterising electrical ageing in solid dielectrics through ex-situ experiments that seek to reproduce the chemistry of electrical treeing in bulk. Plaque specimens of a range of polymers, including polyethylene, polystyrene, polyether ether ketone and silicone rubber, were subjected to surface ageing via corona discharge in air or in a closed cell where the atmosphere can be controlled and adjusted. The residual products on both the sample surface and the high voltage electrode were characterised by Raman microprobe spectroscopy and the resulting fingerprints were compared with those previously identified within electrical trees. Analysis of the electrodes aged in air and nitrogen revealed varying evidence of sp2 hybridized carbon, and fluorescence, both of which are products previously associated with the processes involved in electrical treeing. The significance of the results is discussed with respect to electrical treeing.
  • Keywords
    Raman spectroscopy; dielectric materials; electrodes; polymers; silicone rubber; trees (electrical); Raman microprobe spectroscopy; controlled atmosphere; corona discharge; dielectric material; electrical ageing; electrical treeing; high voltage electrode; plaque specimen; polyether ether; polyethylene; polymer; polystyrene; residual product; silicone rubber; solid dielectrics; surface ageing; Aging; Carbon; Corona; Electrodes; Fluorescence; Materials; Rubber;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
  • Conference_Location
    West Lafayette, IN
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-9468-2
  • Type

    conf

  • DOI
    10.1109/CEIDP.2010.5723948
  • Filename
    5723948