Title :
Pattern search in hierarchical high-level designs
Author :
Terem, Zvi ; Kamhi, Gila ; Vardi, Moshe Y. ; Irron, Amitai
Author_Institution :
Logic Validation Technol., Intel Corp., Haifa, Israel
Abstract :
The paper focuses on using algorithms for design pattern matching to address the challenges of designs at RT and higher abstraction levels. The crux of our approach is modeling designs and patterns as graphs, which lets us express design pattern matching as subgraph isomorphism. We apply a constraint-satisfaction approach and address the problem of both exact and generalized matching. Our experimental results confirm the applicability of our approach on industrial test cases.
Keywords :
graph theory; integrated circuit design; logic design; microprocessor chips; pattern matching; constraint-satisfaction approach; design pattern matching; graphs; hierarchical high-level designs; logic design; microprocessor design; modeling levels; pattern search; subgraph isomorphism; Algorithm design and analysis; Concrete; Design engineering; Formal verification; Logic design; NP-complete problem; Pattern matching; Resource management; Testing;
Conference_Titel :
Electronics, Circuits and Systems, 2004. ICECS 2004. Proceedings of the 2004 11th IEEE International Conference on
Print_ISBN :
0-7803-8715-5
DOI :
10.1109/ICECS.2004.1399732