DocumentCode :
2658344
Title :
On the use of Raman and FTIR spectroscopy for the analysis of silica-based nanofillers
Author :
Yeung, C. ; Gherbaz, G. ; Vaughan, A.S.
Author_Institution :
Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
fYear :
2010
fDate :
17-20 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
This paper details our research into the interfacial regions of nanocomposites, using vibrational spectroscopy to characterize the surface chemistry of differently modified particulate fillers. Results obtained from both nano- and micro-silica are reported as a function of silane treatment. Materials with varying surface concentrations of epoxide groups were produced by altering the chemical processing conditions. Raman spectroscopy is capable of providing qualitative data concerning the functionalization level, but the technique is incapable of providing absolute concentrations. Although FTIR should be capable of providing more quantitative data, anomalously high apparent concentrations are obtained, suggesting that the interactions occurring within dispersed particulate systems are rather more complex than implied by classical Beer Lambert behavior.
Keywords :
Fourier transform spectra; Raman spectra; infrared spectra; interface structure; nanocomposites; nanoparticles; silicon compounds; surface chemistry; surface composition; Beer Lambert property; FTIR spectroscopy; Raman spectroscopy; SiO2; chemical processing; interfacial phenomena; nanocomposites; silane treatment; silica-based nanofillers; surface chemistry; surface concentration; vibrational spectroscopy; Chemicals; Nanocomposites; Raman scattering; Silicon compounds; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
Conference_Location :
West Lafayette, IN
ISSN :
0084-9162
Print_ISBN :
978-1-4244-9468-2
Type :
conf
DOI :
10.1109/CEIDP.2010.5723954
Filename :
5723954
Link To Document :
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