DocumentCode :
2658438
Title :
Ultra-high resolution phase difference measurement method
Author :
Shaofeng Dong ; Wei Zhou ; Baoqiang Du ; Changzhe Jiao
Author_Institution :
Dept. of Meas. & Instrum., Xidian Univ., Xi´an, China
fYear :
2012
fDate :
21-24 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
This paper reveals the quantized phase step phenomenon between every two cyclical signals and its characteristics. With these characteristics, ultra-high resolution phase difference measurement limited by the quantized phase step and its corresponding measurements can be achieved. The princple that the quantized phase steps between two radio frequencies are usually less than picosecond, femtosecond and even sub-femtoseconds, namely, the princple that the corresponding equivalent phase comparison frequency between two radio frequencies can enter into the microwave or light bands is also revealed, which provides a foundation for the precise link based on phase group processing between frequencies in different bands. In this paper, an ultra-high resolution phase difference measurement method based on the quantized phase step phenomenon and the phase coincidence detection is proposed. By introducing an intermediate frequency, this method utilizes the quantized phase step phenomenon between the measured frequency and the intermediate frequency to measure the phase difference. Highspeed A/D sampling and data processing are used to improve the phase coincidence detection accuracy.
Keywords :
phase measurement; quantisation (signal); signal detection; cyclical signals; data processing; high speed A/D sampling; intermediate frequency; light bands; microwave; phase coincidence detection; phase group processing; quantized phase step phenomenon; radio frequency; ultrahigh resolution phase difference measurement method; Data processing; Frequency measurement; Frequency synthesizers; Logic gates; Phase measurement; Signal resolution; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2012 IEEE International
Conference_Location :
Baltimore, MD
ISSN :
1075-6787
Print_ISBN :
978-1-4577-1821-2
Type :
conf
DOI :
10.1109/FCS.2012.6243646
Filename :
6243646
Link To Document :
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