DocumentCode :
2658528
Title :
DC conduction in epoxy based nano- and mesocomposites
Author :
Andritsch, Thomas ; Kochetov, Roman ; Morshuis, Peter H F ; Smit, Johan J.
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
fYear :
2010
fDate :
17-20 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
Various samples based on bisphenol-A type epoxy resin were prepared. Composites were produced containing various amounts of aluminum oxide, aluminum nitride and magnesium oxide, using ex-situ polymerization of surface functionalized particles. The average particle size of the used filler material ranged between 22 nm (magnesium oxide) and 60 nm (aluminum nitride). Synthesis of the samples is described in detail. The structure of these composites was thoroughly analyzed, using both scanning and transmission electron microscopy. A structural variance could be discerned due to the different filler loadings ranging from 0.5 to 5% per weight. The samples were divided into nano- and mesocomposites, according to the microscopic analysis results. Conduction current measurement was performed in a three-terminal cell by means of an electrometer. To obtain a clear view on the conduction mechanisms involved, dc poling field strengths between 1 and 5 kV/mm were applied. The changes of the dc conductivity in nanocomposites compared to the unfilled host material are shown.
Keywords :
alumina; aluminium compounds; dielectric polarisation; electrical conductivity; filled polymers; magnesium compounds; nanocomposites; nanofabrication; nanoparticles; particle size; polymerisation; resins; scanning electron microscopy; transmission electron microscopy; Al2O3; AlN; MgO; aluminum nitride; aluminum oxide; bisphenol-A type epoxy resin; conduction current measurement; dc conduction; dc poling field strengths; epoxy based mesocomposite; epoxy based nanocomposite; filler material; magnesium oxide; microscopic analysis; nanoparticles; particle size; polymerization; scanning electron microscopy; size 22 nm to 60 nm; surface functionalized particles; transmission electron microscopy; Aluminum oxide; Conductivity; Current density; Dielectrics; Nanocomposites; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
Conference_Location :
West Lafayette, IN
ISSN :
0084-9162
Print_ISBN :
978-1-4244-9468-2
Type :
conf
DOI :
10.1109/CEIDP.2010.5723965
Filename :
5723965
Link To Document :
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