• DocumentCode
    2658584
  • Title

    Predicting phase noise in crystal oscillators

  • Author

    Galliou, Serge ; Sthal, Fabrice ; Gufflet, Nicolas ; Mourey, Marc

  • Author_Institution
    Lab. de Chronometrie Electron. et Piezoeletricite, ENSMM, Besancon, France
  • fYear
    2003
  • fDate
    4-8 May 2003
  • Firstpage
    499
  • Lastpage
    502
  • Abstract
    An enhanced phase noise model allows to predict the phase noise in crystal oscillators. It is based on an improvement of the mathematical analysis proposed by G. Sauvage. In this model, power spectral densities of phase fluctuations are computed in different points of the oscillator loop. They are calculated from their correlation functions. The resonator caused noise as well as the amplifier caused noise are taken into account and distinguished. In order to validate this model, the behavior of about ten of 10 MHz quartz crystal oscillators is observed and analyzed. These oscillators have been chosen in a facility production. Resonators have been selected according to the value of their resonant frequency and their motional resistance. We attempt to measure separately the amplifier and resonator caused noises by means of a passive method. The phase noise of the overall oscillator working in closed loop is provided by the usual active method. Theoretical and experimental results are compared and discussed.
  • Keywords
    amplifiers; crystal oscillators; mathematical analysis; phase noise; quartz; 10 MHz; SiO2; amplifier noise; correlation functions; mathematical analysis; phase fluctuations; phase noise; power spectral density; quartz crystal oscillators; resonant frequency; resonator noise; Band pass filters; Chemical technology; Fluctuations; Oscillators; Phase noise; Predictive models; Production; Resonant frequency; Resonator filters; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-7688-9
  • Type

    conf

  • DOI
    10.1109/FREQ.2003.1275142
  • Filename
    1275142