DocumentCode :
2658598
Title :
Residual PM and AM noise measurements, noise figure and jitter calculations of 100 GHz amplifiers
Author :
Howe, D.A. ; Ostrick, J.R.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2003
fDate :
4-8 May 2003
Firstpage :
503
Lastpage :
515
Abstract :
We report the first definitive PM and AM noise measurements at 100 GHz of indium phosphide (InP) amplifiers operating at 5 K, 77 K, and room temperature. Amplifier gain ranged from +7 dB to +30 dB, depending on input RF power levels and operating bias current and gate voltages. The measurement system, calibration procedure, and amplifier configuration are described along with strategies for reducing the measurement system noise floor in order to accurately make these measurements. We compute amplifier noise figure with an ideal oscillator signal applied and, based on the PM noise measurements, obtain NF=0.8 dB, or a noise temperature of 59 K. Measurement uncertainty is estimated at ±0.3 dB. Results show that the use of the amplifier with an ideal 100 GHz reference oscillator would set a lower limit on rms clock jitter of 44.2 fs in a 20 ps sampling interval, if the power into the amplifier were -31.6 dBm. For comparison, clock jitter is 16 fs with a commercial room-temperature amplifier operating in saturation with an input power of -6.4 dBm.
Keywords :
III-V semiconductors; VHF amplifiers; amplitude modulation; indium compounds; noise measurement; phase modulation; phase noise; semiconductor device measurement; semiconductor device noise; timing jitter; 100 GHz; 16 fs; 293 to 298 K; 44.2 fs; 5 K; 7 to 30 dB; 77 K; AM noise measurements; InP; PM noise measurements; amplifier gain; amplifier noise figure; amplitude modulation noise measurements; clock jitter; gate voltages; ideal oscillator signal; indium phosphide amplifiers; jitter analysis; noise temperature; operating bias current; phase modulation noise measurements; radiofrequency power levels; room temperature; Clocks; Indium phosphide; Jitter; Noise figure; Noise measurement; Oscillators; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-7688-9
Type :
conf
DOI :
10.1109/FREQ.2003.1275143
Filename :
1275143
Link To Document :
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