• DocumentCode
    2658671
  • Title

    Blind Image Tampering Identification Based on Histogram Features

  • Author

    Cai, Kaiwei ; Lu, Xiaoqing ; Song, Jianguo ; Wang, Xiao

  • Author_Institution
    State Key Lab. of Digital Publishing Technol., Peking Univ., Beijing, China
  • fYear
    2011
  • fDate
    4-6 Nov. 2011
  • Firstpage
    300
  • Lastpage
    303
  • Abstract
    Nowadays, digital forensics has emerged as an important research field with applications of authenticity/integrality verification for digital data. In this paper, we focus on image forensic techniques and propose a blind scheme for image tampering identification which is capable to determine the tampering type. Since tampering operations bring in changes to neighboring pixels, we suggest employing the difference image (the image composed of differences of adjacent pixels) for forensic analysis. More specifically, we take the histogram of difference image to construct a feature set, and then use these histogram features to train a Support Vector Machine(SVM) classifier. In this way, the novel scheme can efficiently identify usual image operations such as scaling, JPEG compression, linear and nonlinear filtering. Besides, its superiority over other state-of-the-art work is also demonstrated experimentally.
  • Keywords
    authorisation; computer forensics; feature extraction; image classification; image watermarking; support vector machines; SVM classifier training; blind image tampering identification; difference image histogram; digital data authenticity verification; digital data integrality verification; digital forensics; forensic analysis; histogram features; support vector machine; Digital images; Feature extraction; Forensics; Histograms; Image coding; Shape; Transform coding; Digital image forensics; difference image; histogram; tampering identification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia Information Networking and Security (MINES), 2011 Third International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1795-6
  • Type

    conf

  • DOI
    10.1109/MINES.2011.116
  • Filename
    6103777