• DocumentCode
    2658682
  • Title

    In situ measurement of ceramic vacuum chamber conductive coating quality

  • Author

    Doose, C. ; Harkay, K. ; Kim, S. ; Milton, S.

  • Author_Institution
    Adv. Photon Souce, Argonne Nat. Lab., IL, USA
  • Volume
    3
  • fYear
    1997
  • fDate
    12-16 May 1997
  • Firstpage
    3577
  • Abstract
    A method for measuring the relative surface resistivity and quality of conductive coatings on ceramic vacuum chambers was developed. This method is unique in that it allows one to test the coating even after the ceramic chamber is installed in the accelerator and under vacuum; furthermore, the measurement provides a localized surface reading of the coating conductance. The method uses a magnetic probe of wire wound on a ferrite and an LCR meter. The probe is calibrated using the measured DC end-to-end resistance of the tube under test and by comparison to a high quality test surface. The measurement method has also been verified by comparison to high frequency impedance measurements. A detailed description, results, and sensitivity of the technique are given here
  • Keywords
    ceramics; electron accelerators; protective coatings; storage rings; surface conductivity; vacuum apparatus; APS; Advanced Photon Source; accelerator; ceramic vacuum chamber conductive coating quality; high frequency impedance; in situ measurement; localized surface reading; magnetic probe; relative surface resistivity; Ceramics; Coatings; Conductivity measurement; Electrical resistance measurement; Impedance measurement; Life estimation; Probes; Surface resistance; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1997. Proceedings of the 1997
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    0-7803-4376-X
  • Type

    conf

  • DOI
    10.1109/PAC.1997.753279
  • Filename
    753279