DocumentCode
2658682
Title
In situ measurement of ceramic vacuum chamber conductive coating quality
Author
Doose, C. ; Harkay, K. ; Kim, S. ; Milton, S.
Author_Institution
Adv. Photon Souce, Argonne Nat. Lab., IL, USA
Volume
3
fYear
1997
fDate
12-16 May 1997
Firstpage
3577
Abstract
A method for measuring the relative surface resistivity and quality of conductive coatings on ceramic vacuum chambers was developed. This method is unique in that it allows one to test the coating even after the ceramic chamber is installed in the accelerator and under vacuum; furthermore, the measurement provides a localized surface reading of the coating conductance. The method uses a magnetic probe of wire wound on a ferrite and an LCR meter. The probe is calibrated using the measured DC end-to-end resistance of the tube under test and by comparison to a high quality test surface. The measurement method has also been verified by comparison to high frequency impedance measurements. A detailed description, results, and sensitivity of the technique are given here
Keywords
ceramics; electron accelerators; protective coatings; storage rings; surface conductivity; vacuum apparatus; APS; Advanced Photon Source; accelerator; ceramic vacuum chamber conductive coating quality; high frequency impedance; in situ measurement; localized surface reading; magnetic probe; relative surface resistivity; Ceramics; Coatings; Conductivity measurement; Electrical resistance measurement; Impedance measurement; Life estimation; Probes; Surface resistance; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location
Vancouver, BC
Print_ISBN
0-7803-4376-X
Type
conf
DOI
10.1109/PAC.1997.753279
Filename
753279
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