Title :
On-chip area-efficient spectrum analyzer for testing analog IC
Author :
Domínguez, M.A. ; Ausín, J.L. ; Torelli, G. ; Duque-Carillo, J.F.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. de Extremadura, Badajoz, Spain
Abstract :
The paper presents an effective approach to the design of on-chip spectrum analyzers based on switched-capacitor (SC) techniques. High programmability resolution is obtained by using a non-uniform sampling scheme without modifying any capacitor value. As a result, capacitor spread and total capacitor area are reduced as compared to traditional solutions and, hence, test area overhead can be minimized. To prove the feasibility of the proposed approach, the design and the implementation of a 0.35 μm CMOS SC spectrum analyzer are discussed. Simulation results confirm that high measurement accuracy can be achieved.
Keywords :
CMOS analogue integrated circuits; analogue integrated circuits; built-in self test; integrated circuit testing; sampling methods; spectral analysers; switched capacitor networks; 0.35 micron; CMOS spectrum analyzer; analog IC testing; built-in self-test; capacitor area; capacitor spread; nonuniform sampling scheme; on-chip spectrum analyzer; switched-capacitor techniques; test area overhead; Analog integrated circuits; Bandwidth; CMOS technology; Capacitors; Circuit testing; Filters; Frequency conversion; Integrated circuit testing; Sampling methods; Spectral analysis;
Conference_Titel :
Electronics, Circuits and Systems, 2004. ICECS 2004. Proceedings of the 2004 11th IEEE International Conference on
Print_ISBN :
0-7803-8715-5
DOI :
10.1109/ICECS.2004.1399751
