DocumentCode
2658939
Title
Computer-Controlled Infrared Microscope for Thermal Analysis of Microwave Transistors
Author
Sechi, F.N. ; Perlman, B.S. ; Cusack, J.M.
fYear
1977
fDate
21-23 June 1977
Firstpage
143
Lastpage
146
Abstract
A new technique for acquiring the temperature profile of microwave power transistors by infrared scanning has been developed. It provides for emissivity calibration using an infrared microscope interfaced with a computer.
Keywords
Calibration; Infrared detectors; Microscopy; Microwave theory and techniques; Microwave transistors; Optical computing; Power transistors; Radiation detectors; Temperature measurement; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1977 IEEE MTT-S International
Conference_Location
San Diego, CA, USA
Type
conf
DOI
10.1109/MWSYM.1977.1124387
Filename
1124387
Link To Document