• DocumentCode
    2658940
  • Title

    Amplitude-frequency effects of Y-cut langanite and langatate

  • Author

    Kim, Yoonkee

  • Author_Institution
    Res. Dev. & Eng. Center, US Army Commun.-Electron. Command, Fort Monmouth, NJ, USA
  • fYear
    2003
  • fDate
    4-8 May 2003
  • Firstpage
    631
  • Lastpage
    636
  • Abstract
    Amplitude-frequency effects of a y-cut langanite (LGN) resonator and a y-cut langatate (LGT) resonator were measured. The frequency shifts from the baseline frequency with 1 mA were measured as a function of drive currents up to 28 mA. While high drive current shifted the frequency, it also heated the crystal locally, causing temperature-related frequency changes. The local heat transfer and its influence on the frequency were analyzed. The amplitude-frequency shift was effectively measured, not affected by the temperature-related frequency changes. It is found that the 3rd, 5th, and 7th overtones (OT´s) behave as soft springs, i.e., resonant frequency decreases as drive current increases. The drive sensitivity coefficients of the 3rd and 5th OT´s are in the vicinity of -2 ppm/(current density in [mA/mm2])2 or -2 ppb/(current in [mA])2 for both resonators. The 7th OT´s are higher than the other OT´s: -5∼-7 ppb/mA2. The lowest drive sensitivity is -1.2 ppb/mA2 on the 5th OT of the LGT.
  • Keywords
    crystal resonators; frequency measurement; gallium compounds; heat transfer; lanthanum compounds; piezoelectric materials; 1 mA; La3Ga5.5Nb0.5O14; La3Ga5.5Ta0.5O14; amplitude-frequency effect; drive current shift; drive sensitivity coefficient; frequency shift; heat transfer; langanite resonator; langatate resonator; resonant frequency; Detectors; Dielectric materials; Frequency measurement; Niobium; Ovens; Piezoelectric materials; Resistors; Resonant frequency; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-7688-9
  • Type

    conf

  • DOI
    10.1109/FREQ.2003.1275164
  • Filename
    1275164