• DocumentCode
    2659099
  • Title

    Design and synthesis of self-checking VLSI circuits and systems

  • Author

    Jha, Niraj K. ; Wang, Sying-Jyan

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • fYear
    1991
  • fDate
    14-16 Oct 1991
  • Firstpage
    578
  • Lastpage
    581
  • Abstract
    Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, and thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. Methods are explored for the cost-effective design of combinational and sequential functional circuits, checkers and systems
  • Keywords
    VLSI; built-in self test; error detection; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; combinatorial circuits; permanent faults; self-checking VLSI circuits; self-checking functional circuits; sequential functional circuits; Circuit faults; Circuit synthesis; Circuits and systems; Contamination; Design methodology; Electrical fault detection; Fault detection; Logic; Redundancy; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-2270-9
  • Type

    conf

  • DOI
    10.1109/ICCD.1991.139977
  • Filename
    139977