DocumentCode
2659099
Title
Design and synthesis of self-checking VLSI circuits and systems
Author
Jha, Niraj K. ; Wang, Sying-Jyan
Author_Institution
Dept. of Electr. Eng., Princeton Univ., NJ, USA
fYear
1991
fDate
14-16 Oct 1991
Firstpage
578
Lastpage
581
Abstract
Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, and thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. Methods are explored for the cost-effective design of combinational and sequential functional circuits, checkers and systems
Keywords
VLSI; built-in self test; error detection; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; combinatorial circuits; permanent faults; self-checking VLSI circuits; self-checking functional circuits; sequential functional circuits; Circuit faults; Circuit synthesis; Circuits and systems; Contamination; Design methodology; Electrical fault detection; Fault detection; Logic; Redundancy; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on
Conference_Location
Cambridge, MA
Print_ISBN
0-8186-2270-9
Type
conf
DOI
10.1109/ICCD.1991.139977
Filename
139977
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