Title :
Stress-induced frequency shifts in langasite thickness-mode resonators
Author :
Kosinski, J.A. ; Pastore, R.A., Jr. ; Yang, X. ; Yang, J. ; Turner, J.A.
Author_Institution :
US Army CECOM, Fort Monmouth, NJ, USA
Abstract :
In this paper, we report on our study of stress-induced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly-rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined. The analysis makes use of the third-order material constants that are available for langasite but not for its isomorphs.
Keywords :
crystal resonators; gallium compounds; lanthanum compounds; stress effects; vibrations; La3Ga5SiO14; doubly rotated plate; first order perturbation integral; langasite thickness mode resonator; stress induced frequency shift; thickness vibration; Anisotropic magnetoresistance; Elasticity; Electrodes; Piezoelectric devices; Resonant frequency; Stress; Surface acoustic waves; Vibrations;
Conference_Titel :
Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
Print_ISBN :
0-7803-7688-9
DOI :
10.1109/FREQ.2003.1275181
