X-ray angle sorting of small-size quartz blanks using the Ω-Scan-state and perspective

Recently developed angle-sorting machines for AT-cut quartz based on the Ω-Scan method allow the measurement of small blanks down to about 1 mm², the position-dependent measurement of wafers, as well as the determination of absolute cutting angles. The twin apparatus ("The Carousel") reduces the cycling time nearly to one third. Distributions of cutting-angles measured on wafers and blanks show that there can exist appreciable changes, which may have consequences referring to the active oscillator area. Therefore, the use of polycapillary optics is discussed to adapt the irradiated area to the active one as well as to avoid systematic errors measuring still smaller blanks. Very probably, these optics would also lead to significantly smaller statistic errors and/or shorter cycling times.