The X-ray angle measurement of doubly rotated quartz blanks with any cutting angle using the Ω-Scan method

The application range of the Ω-Scan method and the existing SC machine can be essentially extended by reducing the restrictions given by the measuring arrangement and the precision demands. For the not included orientations, other reflection combinations and geometries have to be used. For the determination of an arbitrary unknown orientation, the incidence angle of the X-ray beam must be varied over a larger range, until at least three reflection pairs of preselected types of reflections have been found. In order to enable such measurements, a more or less universal apparatus has to be used, working in a partially or completely automated mode. The method and the apparatus can be applied to the orientation determination and to the adjustment for the subsequent cutting of arbitrary single crystals.