DocumentCode
265956
Title
TLNL: A novel two level node labeling algorithm for frequent pattern trees
Author
Siva Rama Prasad, R. ; Kalyan Chakravarthy, N.S. ; Bujji Babu, D.
Author_Institution
Dept. of I.B Studies, Acharya Nagarjuna Univ., Guntur, India
fYear
2014
fDate
27-29 Aug. 2014
Firstpage
226
Lastpage
233
Abstract
In the area of Data Mining, We generally use many techniques for data analysis, among them, association rule learning is a well-liked and well researched technique for discover the interesting relations among the variables in large databases. Association rules are a part of intelligent systems because all the intelligent systems are using the associations. Association rules are usually needed to satisfy a user-individual minimum support and minimum confidence at the same time. Apriori algorithm (Static) and FP_Growth(Dynamic) algorithms are the traditional algorithms used to extract the frequent itemsl. The Frequent Pattern-Growth algorithm is completely depends on fp-tree. In previous, the fp-tree node is labeled only with its support count, due to this, more time takes while traversing to extract the associated items with that particular item. In this paper we are more concentrated on the node labeling scheme of fp-tree in FP-Growth algorithm. Here we propose a new two level node labeling (TLNL) approach for frequent pattern growth tree. The proposed algorithms are fast and efficient algorithms. This paper overcomes the major inconveniences of FP-Growth algorithm for association rule mining with using the newly proposed approach.
Keywords
data mining; database management systems; pattern classification; Apriori algorithm; FP-Growth algorithm; TLNL; associated items; association rule learning; data analysis; data mining; frequent pattern growth algorithm; frequent pattern growth tree; frequent pattern trees; intelligent systems; novel two level node labeling algorithm; two level node labeling; Algorithm design and analysis; Association rules; Current measurement; Databases; Heuristic algorithms; Labeling; Association rule; Data mining; Intelligent System; fp-tree; frequent items; node labeling; support;
fLanguage
English
Publisher
ieee
Conference_Titel
Science and Information Conference (SAI), 2014
Conference_Location
London
Print_ISBN
978-0-9893-1933-1
Type
conf
DOI
10.1109/SAI.2014.6918194
Filename
6918194
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