• DocumentCode
    2659613
  • Title

    Non-linear effects in varactor tuned resonators

  • Author

    Zhou, Liang ; Everard, Jeremy

  • Author_Institution
    Dept. of Electron., York Univ., UK
  • fYear
    2003
  • fDate
    4-8 May 2003
  • Firstpage
    853
  • Lastpage
    860
  • Abstract
    This paper describes the effects of RF power level on the performance of varactor-tuned resonator circuits. A variety of topologies are considered including series and parallel resonators operating in both unbalanced and balanced modes. As these resonators were being designed to produce oscillators with minimum phase noise the insertion loss was set to 6 dB and hence QI/Q0=1/2. To enable accurate analysis and simulation, accurate S parameter and PSPICE models for the varactors were optimised and developed. It is shown that these resonators start to demonstrate non-linear operation at very low power levels demonstrating saturation and lowering of the resonant frequency. On occasion ´squegging´ is observed for modified biasing conditions. The non-linear effects are dependent on the Q, bias voltage and circuit configurations with typical non linear effects occurring at -6 dBm in a circuit with a loaded Q of 63 and a varactor bias voltage 3 volts. Analysis, simulation and measurements are presented which show close correlation.
  • Keywords
    S-parameters; SPICE; VHF oscillators; integrated circuit noise; phase noise; resonators; varactors; 3 V; 6 dB; PSPICE model; RF power; RF power effect; S-parameter; bias voltage; insertion loss; oscillator; parallel resonator; phase noise; resonant frequency; series resonator; squegging circuit; varactor tuned resonator circuit; Analytical models; Circuit topology; Insertion loss; Oscillators; Phase noise; Radio frequency; SPICE; Scattering parameters; Varactors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-7688-9
  • Type

    conf

  • DOI
    10.1109/FREQ.2003.1275202
  • Filename
    1275202