• DocumentCode
    2659623
  • Title

    Computational lithography for nanostructure science and technology

  • Author

    Peckerar, Martin ; Sander, David ; Srivastava, Ankur ; Foli, Adakou

  • Author_Institution
    Maryland Univ., College Park
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    There are two paths to nanostructure patterning. Self-assembly is intriguing, as it makes use of the natural tendency of materials to spontaneously coalesce into shapes of technological importance without relying on complex, expensive tools to do the job. But the number of achievable shapes and workable materials is limited, placing severe restrictions on the types of nanostructures that can be achieved. More-or-less conventional deep ultraviolet (DUV) optical printing techniques have performed astonishingly well for features sizes below 90 nm. Electron beam technology has printed arbitrary patterns with minimum feature sizes on the order of 10´s of nanometers. These techniques do not suffer from the same restrictions on form and materials as self- assembly. There are restrictions, though. We address one of these here: the degree to which patterns can be faithfully reproduced as feature sizes scale to smaller dimensions.
  • Keywords
    electron beam lithography; nanolithography; self-assembly; DUV optical printing techniques; computational lithography; deep ultraviolet optical printing techniques; electron beam technology; nanostructure patterning; nanostructure science; nanostructure technology; self-assembly; Assembly; Electron beams; Electron optics; Lithography; Materials science and technology; Nanostructured materials; Optical materials; Printing; Self-assembly; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1892-3
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422417
  • Filename
    4422417