DocumentCode
2659623
Title
Computational lithography for nanostructure science and technology
Author
Peckerar, Martin ; Sander, David ; Srivastava, Ankur ; Foli, Adakou
Author_Institution
Maryland Univ., College Park
fYear
2007
fDate
12-14 Dec. 2007
Firstpage
1
Lastpage
2
Abstract
There are two paths to nanostructure patterning. Self-assembly is intriguing, as it makes use of the natural tendency of materials to spontaneously coalesce into shapes of technological importance without relying on complex, expensive tools to do the job. But the number of achievable shapes and workable materials is limited, placing severe restrictions on the types of nanostructures that can be achieved. More-or-less conventional deep ultraviolet (DUV) optical printing techniques have performed astonishingly well for features sizes below 90 nm. Electron beam technology has printed arbitrary patterns with minimum feature sizes on the order of 10´s of nanometers. These techniques do not suffer from the same restrictions on form and materials as self- assembly. There are restrictions, though. We address one of these here: the degree to which patterns can be faithfully reproduced as feature sizes scale to smaller dimensions.
Keywords
electron beam lithography; nanolithography; self-assembly; DUV optical printing techniques; computational lithography; deep ultraviolet optical printing techniques; electron beam technology; nanostructure patterning; nanostructure science; nanostructure technology; self-assembly; Assembly; Electron beams; Electron optics; Lithography; Materials science and technology; Nanostructured materials; Optical materials; Printing; Self-assembly; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2007 International
Conference_Location
College Park, MD
Print_ISBN
978-1-4244-1892-3
Electronic_ISBN
978-1-4244-1892-3
Type
conf
DOI
10.1109/ISDRS.2007.4422417
Filename
4422417
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