Title :
Analysis of the Major Loss Processes in Mid-Infrared Type-II fiWfl Diode Lasers
Author :
O´Brien, K. ; Adams, A.R. ; Sweeney, S.J. ; Jin, S.R. ; Ahmad, C.N. ; Murdin, B.N. ; Canedy, C.L. ; Vurgaftman, I. ; Meyer, J.R.
Author_Institution :
Adv. Technol. Inst., Surrey Univ., Guildford
Abstract :
The results from high-pressure and low-temperature measurements on mid-infrared type-II W-structure lasers suggest that Auger recombination is the major loss process that prevents their continuous-wave operation at room temperature
Keywords :
Auger effect; laser beams; optical losses; semiconductor lasers; thermo-optical effects; Auger recombination; continuous-wave operation; high-pressure measurement; loss analysis; low-temperature measurement; mid-infrared type-II "W" diode lasers; Diode lasers; Gas lasers; Photonic band gap; Quantum well lasers; Radiative recombination; Semiconductor lasers; Spontaneous emission; Temperature dependence; Temperature distribution; Threshold current;
Conference_Titel :
Semiconductor Laser Conference, 2006. Conference Digest. 2006 IEEE 20th International
Conference_Location :
Kohala Coast, HI
Print_ISBN :
0-7803-9560-3
DOI :
10.1109/ISLC.2006.1708077
