• DocumentCode
    2660108
  • Title

    Design and optimization of the SOI field effect diode (FED)

  • Author

    Yang, Yang ; Salman, Akram A. ; Ioannou, Dimitris E. ; Beebe, Stephen G.

  • Author_Institution
    George Mason Univ., Fairfax
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This article deals with the importance of the structure of FED, that lies in the fact that by appropriately biasing it, its operation can be switched between SCR-like and diode-like. For devices with p-type body doping the depletion of electrons beneath G1 imposes an upper limit to the breakdown voltage. This paper proposes to use n-type body doping instead to achieve high breakdown voltage and reduce the gate length for higher turn-on speed and lower on-resistance.
  • Keywords
    field effect devices; optimisation; semiconductor device models; semiconductor diodes; semiconductor doping; silicon-on-insulator; FED structure; SCR operation; SOI; breakdown voltage; electron depletion; field effect diode; n-type body doping; Bipolar transistors; CMOS technology; Channel bank filters; Charge carrier lifetime; Design optimization; Diodes; Doping; Niobium; Space technology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1891-6
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422443
  • Filename
    4422443